Test Vision is today's premier workshop for semiconductor and system test experts, organized with a vision towards the future of test to discuss coming trends, innovations and requirements. It is a highly-anticipated gathering of providers and users of test IP and equipment, all converging to hear and engage with leaders in the field. The conference typically has 100+ participants and is held in conjunction with Semicon West, assuring access to a wide range of expertise and experience. This year’s theme is “Ground Breaking Innovations in Test”
The growth in autonomous driving and the connected “everything” is driving the demand for semiconductors. This trend is putting more pressure on test costs as a result of higher coverage requirements or lower average selling prices. Test must become even smarter to address the increased quality demands, while at the same time remaining economical. Greater computational power coupled with increased analog and sensor content will force changes in test strategies due to more advanced packaging, heterogeneous integration, higher performance analog, and increasing RF complexity. To address those challenges, all the tools in the arsenal must be brought to bear; increasing test instrumentation integration, smarter test strategies, self-test, adaptive test, system level test, and more sophisticated test hardware.
Fresh Perspectives Wanted
With these topics as the backdrop, we intend to spark lively debate. This means picking apart the overall device production process and examining how test could in fact become its ultimate “enabler”. To this end, we’re seeking papers that offer thought-provoking and even controversial ideas. We especially encourage contributions from individuals that have spent time in the “test trenches. “Moore’s Law” and “More than Moore” packaging advancements still guide our roadmaps as the race for denser, larger, faster and highly heterogeneous devices continues. Now, add the near-instantaneous time-to-market imperatives and the new challenges of 7nm processes and beyond, and the test complexities intensify. This calls for new innovations in DFT, test methodologies, wafer probing technology and device manufacturing - to build valuable solutions for test IP and equipment developers, as well as tool providers and users. So, at Test Vision Symposium, we’ll ask questions like this: What can we do differently to provide testing cost effectively with dppm rates approaching zero? What R & D tools are needed for today’s and tomorrow’s devices? What will test cell (ATE, fixtures, handlers or probers and probe cards) need to look like in 2019 and beyond? How can test be better integrated in to the manufacturing process? Are today’s technologies adequate for the future? If not, what can we do to close the gap?
Representative topics include, but are not limited to:
Call for Posters
Owing to its continuing success, we will again include a Poster Session on July 10, 2019. We encourage participation by seasoned test experts, as well as students, post-docs, and others with interesting observations to share on how your test process has adapted to the ever-changing realities of test.
The poster material must fit 1m x 1m area. The presenting author should be underlined in the poster text. Please set up your poster on July 10, 2019 in the morning and be ready to present the content during the breaks and reception.
Important Information & Deadlines
|April 16||Call for Paper Submissions Due: Test Vision Symposium|
|April 16||Call for Posters Submissions Due: Test Vision Symposium|
|May 17||Author / Speaker Notification: Test Vision Symposium|
|May 17||Poster Notification: Test Vision Symposium|
|June 14||Final Presentation Due (16:9 display format) and PDF Versions: Test Vision Symposium|
|July 10||Set-up of Poster. Poster session on July 10 only.|
|July 10 or 11||Presentation dates for Test Vision Symposium|
To submit an abstract for consideration:
Contact Agnes Cobar at firstname.lastname@example.org or 408.943.7952